It was SUGGESTED that these
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corresponding author. Tel .: +48 713203926; Fax: +48 713283504.
E-mail address: Lukasz.gelczuk@pwr.wroc.pl (Ł. Gelczuk).
Http://dx.doi.org/10.1016/j.sse.2014.02.008
0038-1101 /? Elsevier Ltd. All rights reserved 2,014.
Solid-State Electronics 94 (2 014) 56-60
Contents lists available at ScienceDirect
Solid-State Electronics
Homepage Journal: Www.elsevier.com/locate/sse
? Elsevier Ltd. All rights reserved 2,014.
Ideal characteristics Result from non-localized Lower Barrier
height areas Within a Large Area Barrier height diode with higher
background. These areas are related to discrete structural or
surface defects and imperfections of SiC Material.
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