2.10. Characterization of apples2.1

2.10. Characterization of apples
2.10.1. Microstructure observations
Both surface microstructure and cross-section of apple peels coated
with pullulan coating with and without SBE were examined under
the SEM (type FEI, Quanta 200, Jeol Ltd., Japan). Observations and
micrographs were made in Low Vacuum mode (LV mode) using an
LFD detector, at an accelerating voltage of 30 kV.

ผลลัพธ์ (อังกฤษ) 3:

2.10. Characterization of apples
2.10.1. Microstructure observations
Both surface microstructure and cross-section of apple. Peels coated
with pullulan coating with and without SBE were examined under
the SEM (type FEI Quanta, Ltd, 200 Jeol, Japan).? Observations and
micrographs were made in Low Vacuum mode (LV mode) using an
LFD detector at an, accelerating voltage of 30 kV.