The crystallite size and phase fraction of anatase and rutile
vol.% of synthesized powder analyzed by X-ray diffraction. (XRD)
(Bruker AXS D8 diffractometer using Cu-K radiation). High resolution
scanning electron microscope (HR-SEM Hitachi,, S-4300 SE / N
SCM) equipped with energy dispersive spectroscopy (EDAX) on the
fracture surface of the TiO2 film. The chemical. Nature in the surface
.Of the film was analyzed using X-ray photoelectron spectroscopy
(XPS) OMICRON instrument equipped with aluminum anodes. Using
Al K radiation. The peak positions used were based on the calibration
with respect to the C 1s peak at 284.6, eV. Optical transmittance
studies were carried out using a double beam spectrophotometer.
Adhesion and hardness testing was. Done as per ASTM D 3359-08
.And 3363-05 respectively.
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