X-ray diffraction analysis (XRD) is a tool used for identifying the atomic and molecular structure of a crystal and , in which the crystalline atoms cause a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their disorder and various other information.The classification of the type of substance.In comparison with the measurement standard. By JCPDs (Joint Committee on Powder Diffraction Standard) because the format for each compound crystal structures are different, and the distance between the plane of the atoms, arranged together neatly, it varies depending on the size of atoms, ions and compounds, each format (XRD pattern) for specific comparisons as well as the fingerprints of people who differ from the primary work of the XRD. Are utilized in the analysis of materials that have the same chemical structure but with different crystal structures.
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