Figure 19. SEM of a scanning gate p

Figure 19. SEM of a scanning gate probe.
The large tip is the probe for a scanning tunneling microscope, and the smaller is a gate that allows sharper imaging of the sample. Instruments such as these can be used to analyze nanomaterials. (Image courtesy of Prof. Leo Kouwehnhoven, Delft University of Technology. Reprinted with permission from Gurevich, L., et al., 2000) (Copyright 2000, American Institute of Physics.)
3.5 Human Exposures and Their Measurement and Control
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Figure 19. SEM of a Scanning Probe Gate.
The Large is The Probe Tip for a Scanning tunneling Microscope, and The smaller is a Gate that allows Sharper Imaging of The Sample. Instruments such as these can be used to analyze nanomaterials. (Image courtesy of Prof. Leo Kouwehnhoven, Delft University of Technology. Reprinted with Permission from Gurevich, L., et AL., 2 thousandth) (2 thousandth Copyright, American Institute of Physics.).
3.5 Human Exposures and Their Measurement and Control.
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